Scanning probe microscopy

Results: 577



#Item
531Scanning probe microscopy / Materials science / Electricity / Physical quantities / Quantum electronics / Quantum dot / Electrostatic force microscope / Capacitor / Atomic force microscopy / Chemistry / Physics / Science

VOLUME 83, NUMBER 23 PHYSICAL REVIEW LETTERS

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Source URL: www.columbia.edu

Language: English - Date: 2002-08-01 15:57:26
532Optics / Nanotechnology / Nanomaterials / Electromagnetism / Scanning probe microscopy / Optical microscope / Nanoparticle / Angular resolution / Surface plasmon resonance / Science / Microscopy / Laboratory techniques

Simple Dark-Field Microscopy with Nanometer Spatial Precision and Microsecond Temporal Resolution

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Source URL: www.nojilab.t.u-tokyo.ac.jp

Language: English - Date: 2014-02-17 04:44:41
533Scanning probe microscopy / Charge carriers / Ballistic electron emission microscopy / Schottky barrier / Ohmic contact / Hot carrier injection / Inelastic electron tunneling spectroscopy / Work function / Threshold voltage / Physics / Condensed matter physics / Electromagnetism

Microsc. MicroanaL Microstruct. 31-

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Source URL: mmm.edpsciences.org

Language: English
534Scanning probe microscopy / Kelvin probe force microscope / Surface chemistry / Electricity / Potential / Work function / Volta potential / Vacuum / Electron / Physics / Electromagnetism / Condensed matter physics

Tutorial on Kelvin Probe Measurements By Dr. Rudy Schlaf

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Source URL: rsl.eng.usf.edu

Language: English - Date: 2006-09-27 17:36:18
535Microscopes / Intermolecular forces / Scanning tunneling microscope / Chemistry / Atomic force microscopy / Scanning tunneling spectroscopy / Scanning probe microscopy / Scientific method / Science

Subatomic Features on the Silicon[removed]×7) Surface Observed by Atomic Force Microscopy Franz J. Giessibl, et al.

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Source URL: www-inst.eecs.berkeley.edu

Language: English - Date: 2008-05-05 18:07:04
536Intermolecular forces / Atomic force microscopy / Chemistry / Microscope / Veeco / Scanning probe microscopy / Scientific method / Science

PeakForce Tapping Mode AFM and Quantitative Nanomechanical Measurements Chunzeng Li on behalf of Veeco Team and Collaborators

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Source URL: mse.ustb.edu.cn

Language: English - Date: 2010-08-30 22:20:01
537Microscopes / Scanning probe microscopy / Scanning tunneling microscope / Superlattice / Resonant-tunneling diode / Nanowire / Molecular scale electronics / Anthony E. Siegman / Electronics / Nanotechnology / Physics

Microsoft Word - Reed publication list

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Source URL: www.eng.yale.edu

Language: English - Date: 2013-02-09 22:15:46
538Nanomaterials / Spectroscopy / Near-field scanning optical microscope / Scanning probe microscopy / Quantum electronics / Luminescence / Quantum dot / Cadmium selenide / Heterojunction / Chemistry / Physics / Condensed matter physics

OPTICAL SPECTROSCOPY OF COLLOIDAL CdSe SEMICONDUCTOR NANOSTRUCTURES

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Source URL: etd.nd.edu

Language: English - Date: 2011-06-17 09:55:46
539Swiss Nanoscience Institute / Physics / Materials science / Christoph Gerber / Gerd Binnig / Atomic force microscopy / Scanning tunneling microscope / Basel / Nanoparticle / Science / Scanning probe microscopy / Nanotechnology

SNI update October 2011 Words from the Editor Dear colleagues

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Source URL: www.nanoscience.ch

Language: English - Date: 2012-01-15 08:28:50
540Physics / Microscopy / Measuring instruments / Stepper motor / Scanning probe microscopy / Hysteresis / Piezoelectricity / Sensor / Stepper / Science / Transducers / Technology

Copyright © 2008 American Scientific Publishers All rights reserved Printed in the United States of America

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Source URL: www.academicos.ccadet.unam.mx

Language: English - Date: 2010-11-08 13:51:22
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